AI Patent Summary

Patent Document
#US5345413A
United States Patent
Abstract
The usability of an electrically erasable programmable semiconductor memory device is assured after shipment from the factory despite implementing the device with a user option to selectively configure the security, en- durance, organization, density or protocol of the mem- ory array of the device. The user selected configuration is made permanent and inaccessible for change by pro- gramming associated normally reversible configuration fuses which are rendered incapable of being repro- grammed (reversed) thereafter by the automatic and simultaneous programming of a lockout fuse. Final testing of the device at the factory is permitted by an override of the lockout fuse during testing of the opera- tion of the configuration fuses, and, when the testing is completed, returning, under program control, all fuses to a default condition in which the configuration fuses are limited to one-time programmability as a conse- quence of automatic simultaneous programming of the lockout fuse and configuration fuses at any time after shipment of the device from the factory.
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Patent Classification & AI Product Mapping
Authoritative patent classification definitions mapped to real-world technology domains and commercial product categories.
CPC G11C7/00
Confidence: High
Official Definition
Arrangements for writing information into, or reading information out from, a digital store
PHYSICS > INFORMATION STORAGE > STATIC STORES
AI Technology & Product Mapping
Technology Domain:
Semiconductor Memory Architecture
Product Category:
Non-Volatile Memory ICs
Plain-English Summary:
Circuits and methods for storing data into and retrieving data from digital memory devices.
Relation to Claims:
The patent deals with configuring and programming semiconductor memory devices, which relies on fundamental arrangements for writing and reading data or configuration states.
CPC G11C7/24
Confidence: High
Official Definition
Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
PHYSICS > INFORMATION STORAGE > STATIC STORES
AI Technology & Product Mapping
Technology Domain:
Memory Security & Access Control
Product Category:
Secure Microcontrollers & Protected Memory ICs
Plain-English Summary:
Circuits that protect memory data or configurations from being accidentally or maliciously changed, including security lockout features.
Relation to Claims:
Directly maps to the patent's focus on user-configurable security, permanent configuration fuses, and the automatic simultaneous programming of a lockout fuse to prevent further changes after shipment.
CPC G11C16/00
Confidence: High
Official Definition
Erasable programmable read-only memories
PHYSICS > INFORMATION STORAGE > STATIC STORES
AI Technology & Product Mapping
Technology Domain:
Flash and EEPROM Technology
Product Category:
EEPROM/Flash Memory Devices
Plain-English Summary:
Memory devices that can retain data without power and be erased and reprogrammed.
Relation to Claims:
The invention explicitly addresses electrically erasable programmable semiconductor memory devices (EEPROM/Flash).
CPC G11C16/02
Confidence: High
Official Definition
Erasable programmable read-only memories electrically programmable
PHYSICS > INFORMATION STORAGE > STATIC STORES
AI Technology & Product Mapping
Technology Domain:
Electrically Erasable Memory
Product Category:
EEPROM Memory Chips
Plain-English Summary:
Memory chips that use electrical signals to program and erase stored data or configurations.
Relation to Claims:
The patent specifically details an 'electrically erasable programmable semiconductor memory device' utilizing programmable configuration fuses.
CPC G11C16/06
Confidence: High
Official Definition
Auxiliary circuits, e.g. for writing into memory
PHYSICS > INFORMATION STORAGE > STATIC STORES
AI Technology & Product Mapping
Technology Domain:
Memory Peripheral Circuitry
Product Category:
Memory Integrated Circuits
Plain-English Summary:
Support circuitry on a memory chip used to assist with operations like programming, voltage generation, or testing.
Relation to Claims:
Relates to the auxiliary testing features, factory override mechanisms, and program-control logic used to manage the fuses and default conditions.